Growth service
- Growing high crystalline monolayer and multilayer TMDs (MoS2, WS2, MoSe2, WSe2, …) (10 to 200 µm crystals with large coverage)
- We can grow on the following substrates directly:
- Si
- SiO2
- Sapphire
- SiC
- GaN
- Diamond
- We can transfer TMDs on any desirable substrate
- Growing TMD crystals on 3D nanostructures
- Growth on nonhomogenous surfaces
Device fabrication
We can provide high-quality 2D-based electronic and optoelectronic devices with your design! Our standard device fabrication is on SiO2/Si. You can send your own substrate or give us a hint about your desired substrate.
- Fabrication of photodetector, transistors
and phototransistors based on TMDs
Please provide us with the necessary information about the device design such as:
- Material (MoS2, WS2, MoSe2 ….)
- Length and width of the channel
- The type and thickness of the oxide (top gate- bottom gate)(Al2O3, …)
- Gate thickness
- The thickness of the contacts (e.g. Ti (10 nm)/Au (50 nm))
- Area of the contact pads (100 to 100 µm)
- Layout design (optional)
- Special treatment on the device (please provide us the detail)
- 3d or 2d graphic of the device (favorable)
- Number of the wafers (4 inches) or chips (1 cm to 1 cm)(or your desired size)
Is your design completely different? Contact us through your login page dashboard
You can contact us for more details from your login page dashboard
Measurement services
We can conduct your research and measurement experiments based on your request with the following types of equipment:
- XPS (X-ray Photoelectron Spectroscopy in ultrahigh vacuum)
- STM (Scanning Tunneling microscopy in ultrahigh vacuum)
- AFM (Atomic force microscopy)
- LEED ( Low Energy Electron Diffraction in ultrahigh vacuum)
- UPS (Ultraviolet photoelectron spectroscopy)
- PL (Photoluminescence Spectroscopy)
- SHG-THG (Second/Third-harmonic generation measurement)
- Psi (Thickness measurement)
- Electrical measurements in high vacuum (Transistors, diodes)
- Optoelectrical measurements in high vacuum (Photodetectors, phototransistors)
- OM (High-resolution optical microscopy)
The delivery time and cost of the services are different. Please contact us through your login dashboard for more information.
If your research needs other types of measurements, please get in touch with us through your login dashboard.
Scientific consulting
High-quality scientific consulting to proceed with your research from our best scientists.
We can provide you with scientific consulting in the following fields:
- Material properties
- Electrical characterization
- Optical characterization
- Surface characterization
- Device design
- Photonics
The discussion during the consulting is absolutely confidential.
To get an online appointment for scientific consulting please get in touch with us through your login page dashboard.